Noise analysis for comparator-based circuits

• Main Authors: Sepke, Todd (Contributor), Holloway, Peter (Author), Sodini, Charles G. (Contributor), Lee, Hae-Seung (Contributor)
• Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor)
• Format: Article
• Language: English
• Published: Institute of Electrical and Electronics Engineers, 2011-03-10T21:58:45Z.
• Subjects: Article
• Online Access: Get fulltext

 Noise analysis for comparator-based circuits is presented. The goal is to gain insight into the different sources of noise in these circuits for design purposes. After the general analysis techniques are established, they are applied to different noise sources in the comparator-based switched-capacitor pipeline analog-to-digital converter (ADC). The results show that the noise from the virtual ground threshold detection comparator dominates the overall ADC noise performance. The noise from the charging current can also be significant, depending on the size of the capacitors used, but the contribution was small in the prototype. The other noise sources have contributions comparable to those in op-amp-based designs, and their effects can be managed through appropriate design. In the prototype, folded flicker noise was found to be a significant contributor to the broadband noise because the flicker noise of the comparator extends beyond the Nyquist rate of the converter.