Focal plane instrumentation for the Wide-Field X-ray Telescope

The three X-ray imaging focal planes of the Wide-Field X-ray Telescope (WFXT) Mission will each have a field of view up to 1 degree square, pixel pitch smaller than 1 arcsec, excellent X-ray detection efficiency and spectral resolving power near the theoretical limit for silicon over the 0.2 - 6 keV...

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Bibliographic Details
Main Authors: Bautz, Marshall W. (Contributor), Foster, Richard F. (Contributor), Murray, Stephen S. (Author), WFXT Team (Author)
Other Authors: MIT Kavli Institute for Astrophysics and Space Research (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers, 2011-03-04T21:38:10Z.
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Online Access:Get fulltext
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100 1 0 |a Bautz, Marshall W.  |e author 
100 1 0 |a MIT Kavli Institute for Astrophysics and Space Research  |e contributor 
100 1 0 |a Bautz, Marshall W.  |e contributor 
100 1 0 |a Bautz, Marshall W.  |e contributor 
100 1 0 |a Foster, Richard F.  |e contributor 
700 1 0 |a Foster, Richard F.  |e author 
700 1 0 |a Murray, Stephen S.  |e author 
700 1 0 |a WFXT Team  |e author 
245 0 0 |a Focal plane instrumentation for the Wide-Field X-ray Telescope 
260 |b Institute of Electrical and Electronics Engineers,   |c 2011-03-04T21:38:10Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/61425 
520 |a The three X-ray imaging focal planes of the Wide-Field X-ray Telescope (WFXT) Mission will each have a field of view up to 1 degree square, pixel pitch smaller than 1 arcsec, excellent X-ray detection efficiency and spectral resolving power near the theoretical limit for silicon over the 0.2 - 6 keV spectral band. We describe the baseline concept for the WFXT focal planes. The detectors are derived from MIT Lincoln Laboratory CCDs currently operating in orbit on Chandra and Suzaku. Here we describe the baseline WFXT focal plane instrumentation and briefly consider options for alternative detector technologies. 
546 |a en_US 
655 7 |a Article 
773 |t Proceedings of SPIE--the International Society for Optical Engineering ; v. 7732