Thermal and Optical Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy

We report high resolution, non-invasive, thermal and optical characterization of semiconductor optical amplifiers (SOAs) and SOA-based photonic integrated circuits (PICs) using thermoreflectance microscopy. Chip-scale temperature imaging of SOAs and PICs, along with an energy balance model, are used...

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Bibliographic Details
Main Authors: Summers, Joseph A. (Contributor), Farzaneh, Maryam (Author), Ram, Rajeev J. (Contributor), Hudgings, Janice A. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers, 2010-05-10T20:53:46Z.
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