Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry

Ellipsometry is an important metrology tool in a plethora of industries. The measurement accuracy can be significantly affected by the existence of Poisson-Gaussian mixed noise. This paper quantifies the induced error on normalized Mueller matrix measurements through statistical analysis. A method i...

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Bibliographic Details
Main Authors: Jiang, Bo (Author), Meng, Kai (Author), Youcef-Toumi, Kamal (Author)
Format: Article
Language:English
Published: The Optical Society, 2022-01-27T13:36:27Z.
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