Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry
Ellipsometry is an important metrology tool in a plethora of industries. The measurement accuracy can be significantly affected by the existence of Poisson-Gaussian mixed noise. This paper quantifies the induced error on normalized Mueller matrix measurements through statistical analysis. A method i...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
The Optical Society,
2022-01-27T13:36:27Z.
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Subjects: | |
Online Access: | Get fulltext |