Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

National Science Foundation (U.S.) (CA No. EEC-1041895)

Bibliographic Details
Main Authors:	Laine, Hannu S. (Author), Vahlman, Henri (Author), Haarahiltunen, Antti (Author), Jensen, Mallory Ann (Author), Modanese, Chiara (Author), Wagner, Matthias (Author), Wolny, Franziska (Author), Buonassisi, Anthony (Author), Savin, Hele (Author)
Other Authors:	Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format:	Article
Language:	English
Published:	Author(s), 2021-12-13T17:00:56Z.
Subjects:	Article
Online Access:	Get fulltext


LEADER	01043 am a22002653u 4500
001	136720.2
042			\|a dc
100	1	0	\|a Laine, Hannu S. \|e author
100	1	0	\|a Massachusetts Institute of Technology. Department of Mechanical Engineering \|e contributor
700	1	0	\|a Vahlman, Henri \|e author
700	1	0	\|a Haarahiltunen, Antti \|e author
700	1	0	\|a Jensen, Mallory Ann \|e author
700	1	0	\|a Modanese, Chiara \|e author
700	1	0	\|a Wagner, Matthias \|e author
700	1	0	\|a Wolny, Franziska \|e author
700	1	0	\|a Buonassisi, Anthony \|e author
700	1	0	\|a Savin, Hele \|e author
245	0	0	\|a Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
260			\|b Author(s), \|c 2021-12-13T17:00:56Z.
856			\|z Get fulltext \|u https://hdl.handle.net/1721.1/136720.2
520			\|a National Science Foundation (U.S.) (CA No. EEC-1041895)
546			\|a en
655	7		\|a Article
773			\|t 10.1063/1.5049255
773			\|t SiliconPV 2018, The 8th International Conference on Crystalline Silicon Photovoltaics

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