Accurate measurement of in-plane thermal conductivity of layered materials without metal film transducer using frequency domain thermoreflectance
Measuring anisotropic thermal conductivity has always been a challenging task in thermal metrology. Although recent developments of pump-probe thermoreflectance techniques such as variable spot sizes, offset pump-probe beams, and elliptical beams have enabled the measurement of anisotropic thermal c...
Main Authors: | Qian, Xin (Author), Ding, Zhiwei (Author), Shin, Jungwoo (Author), Schmidt, Aaron (Author), Chen, Gang (Author) |
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Other Authors: | Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor) |
Format: | Article |
Language: | English |
Published: |
AIP Publishing,
2020-06-12T13:44:46Z.
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Subjects: | |
Online Access: | Get fulltext |
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