Accurate measurement of in-plane thermal conductivity of layered materials without metal film transducer using frequency domain thermoreflectance

Measuring anisotropic thermal conductivity has always been a challenging task in thermal metrology. Although recent developments of pump-probe thermoreflectance techniques such as variable spot sizes, offset pump-probe beams, and elliptical beams have enabled the measurement of anisotropic thermal c...

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Bibliographic Details
Main Authors: Qian, Xin (Author), Ding, Zhiwei (Author), Shin, Jungwoo (Author), Schmidt, Aaron (Author), Chen, Gang (Author)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format: Article
Language:English
Published: AIP Publishing, 2020-06-12T13:44:46Z.
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