Impact of proton-induced transmutation doping in semiconductors for space applications
Critical satellite-based electronics can fail due to irradiation with Van Allen belt trapped protons. While nuclear-reaction-induced transmutation damage is typically ignored, a recent study raised the question of its potential importance in explaining anomalous trends in III-V nBn device operation....
Main Authors: | Logan, Julie V. (Author), Short, Michael P (Author), Webster, Preston T. (Author), Morath, Christian P. (Author), Steenbergen, Elizabeth H. (Author) |
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Other Authors: | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering (Contributor) |
Format: | Article |
Language: | English |
Published: |
Royal Society of Chemistry (RSC),
2020-03-30T19:28:47Z.
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Subjects: | |
Online Access: | Get fulltext |
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