Impact of proton-induced transmutation doping in semiconductors for space applications

Critical satellite-based electronics can fail due to irradiation with Van Allen belt trapped protons. While nuclear-reaction-induced transmutation damage is typically ignored, a recent study raised the question of its potential importance in explaining anomalous trends in III-V nBn device operation....

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Bibliographic Details
Main Authors: Logan, Julie V. (Author), Short, Michael P (Author), Webster, Preston T. (Author), Morath, Christian P. (Author), Steenbergen, Elizabeth H. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering (Contributor)
Format: Article
Language:English
Published: Royal Society of Chemistry (RSC), 2020-03-30T19:28:47Z.
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Online Access:Get fulltext

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