A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures

A Platform for Thermal Property Measurements and Transmission Electron Microscopy of Nanostructures

Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimens atomic-scale structure or defects. To address this deficiency, we have developed a microfabricated, chi...

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Bibliographic Details
Main Authors: Harris, Tom (Author), Shaner, Eric (Author), Swartzentruber, Brian S. (Author), Huang, Jianyu (Author), Sullivan, John (Author), Martinez, Julio C (Contributor), Chen, Gang (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor), Massachusetts Institute of Technology. Department of Physics (Contributor)
Format: Article
Language:English
Published: ASME International, 2018-11-19T18:16:38Z.
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