Electronic fingerprints of Cr and V dopants in the topological insulator Sb₂Te₃

Electronic fingerprints of Cr and V dopants in the topological insulator Sb₂Te₃

By combining scanning tunneling microscopy/spectroscopy and first-principles calculations, we systematically study the local electronic states of magnetic dopants V and Cr in the topological insulator (TI) Sb₂Te₃. Spectroscopic imaging shows diverse local defect states between Cr and V, which agree...

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Bibliographic Details
Main Authors: Zhang, Wenhan (Author), West, Damien (Author), Lee, Seng Huat (Author), Qiu, Yunsheng (Author), Hor, Yew San (Author), Zhang, Shengbai (Author), Wu, Weida (Author), Chang, Cui-zu (Contributor), Moodera, Jagadeesh (Contributor)
Other Authors: Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology) (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2018-10-19T19:48:18Z.
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