MeV-level electron and gamma ray sensitivites of modern far ultraviolet sensitive microchannel plate detectors

MeV-level electron and gamma ray sensitivites of modern far ultraviolet sensitive microchannel plate detectors

The Jovian system is the focus of multiple current and future NASA and ESA missions, but dangerously high radiation levels surrounding the planet make operations of instruments sensitive to high energy electrons or gamma rays problematic. Microchannel plate (MCP) detectors have been the detectors of...

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Bibliographic Details
Main Authors: Davis, Michael W. (Author), Greathouse, Thomas K. (Author), Blase, Ryan C. (Author), Gladstone, G. Randall (Author), Retherford, Kurt D. (Author), Cooke, Chathan M (Contributor)
Other Authors: Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: SPIE, 2018-03-23T17:23:42Z.
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