Pupil slicer design for the NASA-NSF extreme precision Doppler spectrograph concept WISDOM

The WIYN Spectrograph for Doppler Monitoring (WISDOM) was a concept responding to NASA's solicitation for an extreme precision radial velocity instrument for the 3.5 meter WIYN telescope on Kitt Peak in Arizona. In order to meet the spectral resolution requirement of R = 110,000 while maintaini...

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Bibliographic Details
Main Authors: Egan, Mark (Contributor), Furesz, Gabor (Contributor), Simcoe, Robert A. (Author)
Other Authors: MIT Kavli Institute for Astrophysics and Space Research (Contributor), Simcoe, Robert (Contributor), Simcoe, Robert A (Contributor)
Format: Article
Language:English
Published: SPIE, 2017-05-08T14:46:22Z.
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Online Access:Get fulltext
LEADER 01503 am a22002293u 4500
001 108738
042 |a dc 
100 1 0 |a Egan, Mark  |e author 
100 1 0 |a MIT Kavli Institute for Astrophysics and Space Research  |e contributor 
100 1 0 |a Simcoe, Robert  |e contributor 
100 1 0 |a Simcoe, Robert A  |e contributor 
100 1 0 |a Egan, Mark  |e contributor 
100 1 0 |a Furesz, Gabor  |e contributor 
700 1 0 |a Furesz, Gabor  |e author 
700 1 0 |a Simcoe, Robert A.  |e author 
245 0 0 |a Pupil slicer design for the NASA-NSF extreme precision Doppler spectrograph concept WISDOM 
260 |b SPIE,   |c 2017-05-08T14:46:22Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/108738 
520 |a The WIYN Spectrograph for Doppler Monitoring (WISDOM) was a concept responding to NASA's solicitation for an extreme precision radial velocity instrument for the 3.5 meter WIYN telescope on Kitt Peak in Arizona. In order to meet the spectral resolution requirement of R = 110,000 while maintaining good throughput and a manageable beam diameter, the front end design of the instrument employed a pupil slicing technique wherein a collimated beam is sliced and fed to six separate fibers. This paper presents the optical and mechanical design of the pupil slicer subassembly, a unique method of dealing with thermally induced defocus error, and the methods and results of aligning a prototype. 
546 |a en_US 
655 7 |a Article 
773 |t Proceedings of SPIE--the Society of Photo-Optical Instrumentation Engineers