X-ray Photoelectron Spectroscopy (XPS) Analysis of Undoped ZnO and ZnO:Er Thin Films
Undoped ZnO and ZnO:Er thin films were deposited on p-type Si substrates by ultrasonic spray pyrolisis (USP). Undoped and ZnO:Er thin films have been analyzed by using X-ray Photoelectron Spectroscopy (XPS). The results show that the XPS spectrum has two Er peak at ∼157 eV and ∼168 eV. The XPS Zn 2...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Fakultas MIPA Universitas Jember
2015-06-01
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Series: | Jurnal Ilmu Dasar |
Online Access: | https://jurnal.unej.ac.id/index.php/JID/article/view/1052 |