X-ray Photoelectron Spectroscopy (XPS) Analysis of Undoped ZnO and ZnO:Er Thin Films

Undoped ZnO and ZnO:Er  thin films were deposited on p-type Si substrates by ultrasonic spray pyrolisis (USP). Undoped and ZnO:Er thin films have been analyzed by using X-ray Photoelectron Spectroscopy (XPS). The results show that the XPS spectrum has two Er peak at ∼157 eV and ∼168 eV. The XPS Zn 2...

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Bibliographic Details
Main Authors: Iwan Sugihartono, Esmar Budi, Agus Setyo Budi
Format: Article
Language:English
Published: Fakultas MIPA Universitas Jember 2015-06-01
Series:Jurnal Ilmu Dasar
Online Access:https://jurnal.unej.ac.id/index.php/JID/article/view/1052