A Product Quality Monitor Model With the Digital Twin Model and the Stacked Auto Encoder
With the development of intelligent manufacturing and computer science, the system of equipment in the workshop has become more and more complex. In the intricate environment, the state of device changes constantly, which could affect the accuracy of methods since they cannot adapt the changing cont...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9121213/ |