Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design
Abstract The dimension of transistors shrinks with each new technology developed in the semiconductor industry. The extreme scaling of transistors introduces important statistical variations in their process parameters. A large digital integrated circuit consists of a very large number (in millions...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2018-10-01
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| Series: | Journal of Mathematics in Industry |
| Subjects: | |
| Online Access: | http://link.springer.com/article/10.1186/s13362-018-0053-4 |