k-NN and k-NN-ANN Combined Classifier to Assess MOX Gas Sensors Performances Affected by Drift Caused by Early Life Aging
The drift of metal oxide semiconductor (MOX) chemical sensors is one of the most important topics in this field. The work aims to test the performance of MOX gas sensors over the aging process. Firstly, sensors were tested with ethanol to understand their behavior and response changes. In parallel,...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-01-01
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| Series: | Chemosensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2227-9040/8/1/6 |