On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings

Young’s modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip. The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface. A Hertz-contact-based model is further develop...

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Main Authors: H. S. Tanvir Ahmed, Eric Brannigan, Alan F. Jankowski
Format: Article
Language:English
Published: Hindawi Limited 2013-01-01
Series:Journal of Nanotechnology
Online Access:http://dx.doi.org/10.1155/2013/761031
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spelling doaj-fe15eb490aec4f6fa0aa73d37d00c9232020-11-24T23:53:22ZengHindawi LimitedJournal of Nanotechnology1687-95031687-95112013-01-01201310.1155/2013/761031761031On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal CoatingsH. S. Tanvir Ahmed0Eric Brannigan1Alan F. Jankowski2Edward E. Whitacre, Jr. College of Engineering, Mechanical Engineering, Texas Tech University, P. O. Box 41021, Lubbock, TX 79409-1021, USAEdward E. Whitacre, Jr. College of Engineering, Mechanical Engineering, Texas Tech University, P. O. Box 41021, Lubbock, TX 79409-1021, USAEdward E. Whitacre, Jr. College of Engineering, Mechanical Engineering, Texas Tech University, P. O. Box 41021, Lubbock, TX 79409-1021, USAYoung’s modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip. The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface. A Hertz-contact-based model is further developed using higher-order terms in a Taylor series expansion to determine a relationship between the reduced elastic modulus and the shift in the resonant frequency of the cantilever during elastic contact between the diamond tip and sample surface. The tapping mode technique can be used to accurately determine Young’s modulus that corresponds with the crystalline orientation of the sample surface as demonstrated for nanocrystalline nickel, vanadium, and tantalum coatings.http://dx.doi.org/10.1155/2013/761031
collection DOAJ
language English
format Article
sources DOAJ
author H. S. Tanvir Ahmed
Eric Brannigan
Alan F. Jankowski
spellingShingle H. S. Tanvir Ahmed
Eric Brannigan
Alan F. Jankowski
On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
Journal of Nanotechnology
author_facet H. S. Tanvir Ahmed
Eric Brannigan
Alan F. Jankowski
author_sort H. S. Tanvir Ahmed
title On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
title_short On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
title_full On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
title_fullStr On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
title_full_unstemmed On the Tapping Mode Measurement for Young’s Modulus of Nanocrystalline Metal Coatings
title_sort on the tapping mode measurement for young’s modulus of nanocrystalline metal coatings
publisher Hindawi Limited
series Journal of Nanotechnology
issn 1687-9503
1687-9511
publishDate 2013-01-01
description Young’s modulus of nanocrystalline metal coatings is measured using the oscillating, that is, tapping, mode of a cantilever with a diamond tip. The resonant frequency of the cantilever changes when the diamond tip comes in contact with a sample surface. A Hertz-contact-based model is further developed using higher-order terms in a Taylor series expansion to determine a relationship between the reduced elastic modulus and the shift in the resonant frequency of the cantilever during elastic contact between the diamond tip and sample surface. The tapping mode technique can be used to accurately determine Young’s modulus that corresponds with the crystalline orientation of the sample surface as demonstrated for nanocrystalline nickel, vanadium, and tantalum coatings.
url http://dx.doi.org/10.1155/2013/761031
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