Non-equilibrium critical behavior of Heisenberg thin films

In this work we study the non-equilibrium properties of Heisenberg ferromagnetic films using Monte Carlo simulations by short-time dynamic method. By exploring the short-time scaling dynamics, we have found thickness dependency of critical exponents z, θ′ and β/v for ferromagnetic thin film. For cal...

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Bibliographic Details
Main Authors: Shlyakhtich Maria A., Prudnikov Pavel V.
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:EPJ Web of Conferences
Online Access:https://doi.org/10.1051/epjconf/201818511005
Description
Summary:In this work we study the non-equilibrium properties of Heisenberg ferromagnetic films using Monte Carlo simulations by short-time dynamic method. By exploring the short-time scaling dynamics, we have found thickness dependency of critical exponents z, θ′ and β/v for ferromagnetic thin film. For calculating the critical exponents of ferromagnetic films we considered systems with linear size L = 128 and layers number N = 2; 4; 6; 10. Starting from initial configurations, the system was updated with Metropolis algorithm at the critical temperatures
ISSN:2100-014X