High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing

High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing

We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of <inline-formula><math xmlns="http://www.w3.org/1998/Math/Mat...

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Bibliographic Details
Main Authors: Andrea Tognazzi, Davide Rocco, Marco Gandolfi, Andrea Locatelli, Luca Carletti, Costantino De Angelis
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Optics
Subjects:
sensing
metasurface
BIC
Online Access:https://www.mdpi.com/2673-3269/2/3/18

Internet

https://www.mdpi.com/2673-3269/2/3/18

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