Precession electron diffraction – a topical review

• Main Authors: Paul A. Midgley, Alexander S. Eggeman
• Format: Article
• Language: English
• Published: International Union of Crystallography 2015-01-01
• Series: IUCrJ
• Subjects: precession electron diffraction (PED); electron crystallography; electron techniques; electron-based structure analysis
• Online Access: http://scripts.iucr.org/cgi-bin/paper?S2052252514022283

In the 20 years since precession electron diffraction (PED) was introduced, it has grown from a little-known niche technique to one that is seen as a cornerstone of electron crystallography. It is now used primarily in two ways. The first is to determine crystal structures, to identify lattice parameters and symmetry, and ultimately to solve the atomic structure ab initio. The second is, through connection with the microscope scanning system, to map the local orientation of the specimen to investigate crystal texture, rotation and strain at the nanometre scale. This topical review brings the reader up to date, highlighting recent successes using PED and providing some pointers to the future in terms of method development and how the technique can meet some of the needs of the X-ray crystallography community. Complementary electron techniques are also discussed, together with how a synergy of methods may provide the best approach to electron-based structure analysis.