Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis
This paper examines the practical challenges of simplified setups aimed at achieving high-power IGBTs’ <i>I<sub>C</sub></i>–<i>V<sub>CE</sub></i> curve. The slope of this I–V curve (which is defined as on-resistance <i>R<sub>CE</sub>&...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-08-01
|
| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/17/2095 |