Measuring the seismic risk along the Nazca–South American subduction front: Shannon entropy and mutability
<p>Four geographical zones are defined along the trench that is formed due to the subduction of the Nazca plate underneath the South American plate; they are denoted A, B, C and D from north to south; zones A, B and D had a major earthquake after 2010 (magnitude over <span class="inlin...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
Copernicus Publications
2020-11-01
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Series: | Natural Hazards and Earth System Sciences |
Online Access: | https://nhess.copernicus.org/articles/20/2943/2020/nhess-20-2943-2020.pdf |
Summary: | <p>Four geographical zones are defined along the trench that is formed
due to the subduction of the Nazca plate underneath the South American
plate; they are denoted A, B, C and D from north to south; zones A, B
and D had a major earthquake after 2010 (magnitude over <span class="inline-formula">8.0</span>), while
zone C has not, thus offering a contrast for comparison. For each zone,
a sequence of intervals between consecutive seisms with magnitudes
greater than or equal to 3.0 is set up and then characterized by Shannon entropy and
mutability. These methods show a correlation after a major earthquake in
what is known as the aftershock regime but show independence
otherwise. Exponential adjustments to these parameters reveal that
mutability offers a wider range for the parameters to characterize the
recovery compared to the values of the parameters defining the
background activity for each zone before a large earthquake. It is
found that the background activity is particularly high for zone A,
still recovering for zone B, reaching values similar to those of zone A in the case of zone C (without recent major earthquake) and
oscillating around moderate values for zone D. It is discussed how
this can be an indication of more risk of an important future seism
in the cases of zones A and C. The similarities and differences
between Shannon entropy and mutability are discussed and explained.</p> |
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ISSN: | 1561-8633 1684-9981 |