A universal framework for microscope sensorless adaptive optics: Generalized aberration representations

Adaptive optics (AO) methods are widely used in microscopes to improve image quality through correction of phase aberrations. A range of wavefront-sensorless AO schemes exist, such as modal, pupil segmentation zonal, and pixelated piston-based methods. Each of these has a different physical implemen...

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Main Authors: Q. Hu, J. Wang, J. Antonello, M. Hailstone, M. Wincott, R. Turcotte, D. Gala, M. J. Booth
Format: Article
Language:English
Published: AIP Publishing LLC 2020-10-01
Series:APL Photonics
Online Access:http://dx.doi.org/10.1063/5.0022523
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spelling doaj-fad41a17310c481b820b78ee1e7fca442020-11-25T04:04:27ZengAIP Publishing LLCAPL Photonics2378-09672020-10-01510100801100801-1010.1063/5.0022523A universal framework for microscope sensorless adaptive optics: Generalized aberration representationsQ. Hu0J. Wang1J. Antonello2M. Hailstone3M. Wincott4R. Turcotte5D. Gala6M. J. Booth7Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Biochemistry, University of Oxford, Parks Road, Oxford OX1 3QU, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomDepartment of Biochemistry, University of Oxford, Parks Road, Oxford OX1 3QU, United KingdomDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United KingdomAdaptive optics (AO) methods are widely used in microscopes to improve image quality through correction of phase aberrations. A range of wavefront-sensorless AO schemes exist, such as modal, pupil segmentation zonal, and pixelated piston-based methods. Each of these has a different physical implementation that makes direct comparisons difficult. Here, we propose a framework that fits in all sensorless AO methods and facilitates systematic comparisons among them. We introduce a general model for the aberration representation that encompasses many existing methods. Through modeling and experimental verification in a two-photon microscope, we compared sensorless AO schemes with a range of aberration representations to correct both simulated and sample induced aberrations. The results show that different representations can provide a better basis for correction in different experimental scenarios, which can inform the choice of sensorless AO schemes for a particular application.http://dx.doi.org/10.1063/5.0022523
collection DOAJ
language English
format Article
sources DOAJ
author Q. Hu
J. Wang
J. Antonello
M. Hailstone
M. Wincott
R. Turcotte
D. Gala
M. J. Booth
spellingShingle Q. Hu
J. Wang
J. Antonello
M. Hailstone
M. Wincott
R. Turcotte
D. Gala
M. J. Booth
A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
APL Photonics
author_facet Q. Hu
J. Wang
J. Antonello
M. Hailstone
M. Wincott
R. Turcotte
D. Gala
M. J. Booth
author_sort Q. Hu
title A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
title_short A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
title_full A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
title_fullStr A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
title_full_unstemmed A universal framework for microscope sensorless adaptive optics: Generalized aberration representations
title_sort universal framework for microscope sensorless adaptive optics: generalized aberration representations
publisher AIP Publishing LLC
series APL Photonics
issn 2378-0967
publishDate 2020-10-01
description Adaptive optics (AO) methods are widely used in microscopes to improve image quality through correction of phase aberrations. A range of wavefront-sensorless AO schemes exist, such as modal, pupil segmentation zonal, and pixelated piston-based methods. Each of these has a different physical implementation that makes direct comparisons difficult. Here, we propose a framework that fits in all sensorless AO methods and facilitates systematic comparisons among them. We introduce a general model for the aberration representation that encompasses many existing methods. Through modeling and experimental verification in a two-photon microscope, we compared sensorless AO schemes with a range of aberration representations to correct both simulated and sample induced aberrations. The results show that different representations can provide a better basis for correction in different experimental scenarios, which can inform the choice of sensorless AO schemes for a particular application.
url http://dx.doi.org/10.1063/5.0022523
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