Low frequency fluctuation study using a microwave interferometer and Hα line emission measurement systems in the Pilot-PSI device

• Main Authors: M. Yoshikawa, H. v. d. Meiden, R. AL, J. Vernimmen, J. Kohagura, Y. Shima, M. Sakamoto, Y. Nakashima
• Format: Article
• Language: English
• Published: AIP Publishing LLC 2019-08-01
• Series: AIP Advances
• Online Access: http://dx.doi.org/10.1063/1.5099648

A frequency multiplied microwave interferometer, a Hα line emission measurement system, and a high speed camera system were installed on the Pilot-PSI device for low frequency fluctuation study in the detached plasma condition. The two dimensional Hα line emission and its fluctuation were monitored with a fast visible camera with Hα filter. The coherent low frequency fluctuations of frequency of approximately 13 kHz were measured by all measurement systems. The stronger fluctuation intensities were observed in the downstream of the ionization front region in the detached plasma condition. Moreover, we show the clear difference between the strong fluctuation regions of the electron line density and Hα line emission for the first time. This means that the fluctuations of Hα line emissions was caused by not only electrons but also by hydrogen ions.