Low frequency fluctuation study using a microwave interferometer and Hα line emission measurement systems in the Pilot-PSI device
A frequency multiplied microwave interferometer, a Hα line emission measurement system, and a high speed camera system were installed on the Pilot-PSI device for low frequency fluctuation study in the detached plasma condition. The two dimensional Hα line emission and its fluctuation were monitored...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-08-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5099648 |