Influence of Twinning Microstructure of Crystals with Low Tetragonality on a X-Ray Diffraction

• Main Authors: A. I. Ustinov, L. O. Olikhovs'ka, J.-C. Niepce, F. Bernard
• Format: Article
• Language: English
• Published: G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine 2001-03-01
• Series: Успехи физики металлов
• Subjects: x-ray diffraction; diffuse scattering; tetragonal crystal; twins; satellite
• Online Access: https://doi.org/10.15407/ufm.02.01.051

The intensity distributions of the X-rays scattered in the tetragonal single crystal, which represent a complex of the twin domains separated by the coherent parallel boundaries, are simulated. The calculations are performed by using the Monte Carlo method within the framework of a kinematical approach. The thickness distributions of the twin domains are defined according to the geometrical, Gaussian and log normal functions. ‘Critical’ effects of the X-ray scattering are found, namely there is transformation of the tetragonal doublet into singlet or multiplet. As demonstrated, each of characteristics of the tetragonal doublet profile depends on a few parameters of the twin microstructure of a crystal and cell tetragonality as well.