High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization

High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization

This study proposes a high-sensitivity microwave sensor based on an interdigital-capacitor-shaped defected ground structure (IDCS-DGS) in a microstrip transmission line for the dielectric characterization of planar materials. The proposed IDCS-DGS was designed by modifying the straight ridge structu...

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Bibliographic Details
Main Authors:	Junho Yeo, Jong-Ig Lee
Format:	Article
Language:	English
Published:	MDPI AG 2019-01-01
Series:	Sensors
Subjects:	high-sensitivity microwave sensor interdigital-capacitor-shaped defected ground structure permittivity characterization
Online Access:	https://www.mdpi.com/1424-8220/19/3/498

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