High-Sensitivity Microwave Sensor Based on an Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization
This study proposes a high-sensitivity microwave sensor based on an interdigital-capacitor-shaped defected ground structure (IDCS-DGS) in a microstrip transmission line for the dielectric characterization of planar materials. The proposed IDCS-DGS was designed by modifying the straight ridge structu...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-01-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/19/3/498 |