Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory
Preventive maintenance activities require a tool to be offline for long hour in order to perform the prescribed maintenance activities. Although preventive maintenance is crucial to ensure operational reliability and efficiency of the tool, long hour of preventive maintenance activities increases th...
Main Authors: | , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2019-01-01
|
Series: | Computational Intelligence and Neuroscience |
Online Access: | http://dx.doi.org/10.1155/2019/8729367 |
id |
doaj-f886b0f80ff246e9b004e5cfadc7352e |
---|---|
record_format |
Article |
spelling |
doaj-f886b0f80ff246e9b004e5cfadc7352e2020-11-25T01:20:42ZengHindawi LimitedComputational Intelligence and Neuroscience1687-52651687-52732019-01-01201910.1155/2019/87293678729367Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term MemoryTze Chiang Tin0Kang Leng Chiew1Siew Chee Phang2San Nah Sze3Pei San Tan4Faculty of Computer Science and Information Technology, Universiti Malaysia Sarawak, 94300 Kota Samarahan, Sarawak, MalaysiaFaculty of Computer Science and Information Technology, Universiti Malaysia Sarawak, 94300 Kota Samarahan, Sarawak, MalaysiaX-FAB Sarawak Sdn. Bhd., 1 Silicon Drive, Sama Jaya Free Industrial Zone, 93350 Kuching, Sarawak, MalaysiaFaculty of Computer Science and Information Technology, Universiti Malaysia Sarawak, 94300 Kota Samarahan, Sarawak, MalaysiaX-FAB Sarawak Sdn. Bhd., 1 Silicon Drive, Sama Jaya Free Industrial Zone, 93350 Kuching, Sarawak, MalaysiaPreventive maintenance activities require a tool to be offline for long hour in order to perform the prescribed maintenance activities. Although preventive maintenance is crucial to ensure operational reliability and efficiency of the tool, long hour of preventive maintenance activities increases the cycle time of the semiconductor fabrication foundry (Fab). Therefore, this activity is usually performed when the incoming Work-in-Progress to the equipment is forecasted to be low. The current statistical forecasting approach has low accuracy because it lacks the ability to capture the time-dependent behavior of the Work-in-Progress. In this paper, we present a forecasting model that utilizes machine learning method to forecast the incoming Work-In-Progress. Specifically, our proposed model uses LSTM to forecast multistep ahead incoming Work-in-Progress prediction to an equipment group. The proposed model's prediction results were compared with the results of the current statistical forecasting method of the Fab. The experimental results demonstrated that the proposed model performed better than the statistical forecasting method in both hit rate and Pearson’s correlation coefficient, r.http://dx.doi.org/10.1155/2019/8729367 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Tze Chiang Tin Kang Leng Chiew Siew Chee Phang San Nah Sze Pei San Tan |
spellingShingle |
Tze Chiang Tin Kang Leng Chiew Siew Chee Phang San Nah Sze Pei San Tan Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory Computational Intelligence and Neuroscience |
author_facet |
Tze Chiang Tin Kang Leng Chiew Siew Chee Phang San Nah Sze Pei San Tan |
author_sort |
Tze Chiang Tin |
title |
Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory |
title_short |
Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory |
title_full |
Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory |
title_fullStr |
Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory |
title_full_unstemmed |
Incoming Work-In-Progress Prediction in Semiconductor Fabrication Foundry Using Long Short-Term Memory |
title_sort |
incoming work-in-progress prediction in semiconductor fabrication foundry using long short-term memory |
publisher |
Hindawi Limited |
series |
Computational Intelligence and Neuroscience |
issn |
1687-5265 1687-5273 |
publishDate |
2019-01-01 |
description |
Preventive maintenance activities require a tool to be offline for long hour in order to perform the prescribed maintenance activities. Although preventive maintenance is crucial to ensure operational reliability and efficiency of the tool, long hour of preventive maintenance activities increases the cycle time of the semiconductor fabrication foundry (Fab). Therefore, this activity is usually performed when the incoming Work-in-Progress to the equipment is forecasted to be low. The current statistical forecasting approach has low accuracy because it lacks the ability to capture the time-dependent behavior of the Work-in-Progress. In this paper, we present a forecasting model that utilizes machine learning method to forecast the incoming Work-In-Progress. Specifically, our proposed model uses LSTM to forecast multistep ahead incoming Work-in-Progress prediction to an equipment group. The proposed model's prediction results were compared with the results of the current statistical forecasting method of the Fab. The experimental results demonstrated that the proposed model performed better than the statistical forecasting method in both hit rate and Pearson’s correlation coefficient, r. |
url |
http://dx.doi.org/10.1155/2019/8729367 |
work_keys_str_mv |
AT tzechiangtin incomingworkinprogresspredictioninsemiconductorfabricationfoundryusinglongshorttermmemory AT kanglengchiew incomingworkinprogresspredictioninsemiconductorfabricationfoundryusinglongshorttermmemory AT siewcheephang incomingworkinprogresspredictioninsemiconductorfabricationfoundryusinglongshorttermmemory AT sannahsze incomingworkinprogresspredictioninsemiconductorfabricationfoundryusinglongshorttermmemory AT peisantan incomingworkinprogresspredictioninsemiconductorfabricationfoundryusinglongshorttermmemory |
_version_ |
1725132623420850176 |