DOUBLE BOSS SCULPTURED DIAPHRAGM EMPLOYED PIEZORESISTIVE MEMS PRESSURE SENSOR WITH SILICON-ON-INSULATOR (SOI)

• Main Authors: D. SINDHANAISELVI, T. SHANMUGANANTHAM
• Format: Article
• Language: English
• Published: Taylor's University 2017-07-01
• Series: Journal of Engineering Science and Technology
• Subjects: Small scale deflection; Shape; Stress; Double boss; Non-uniform thickness; Silicon-On-Insulator
• Online Access: http://jestec.taylors.edu.my/Vol%2012%20issue%207%20July%202017/12_7_2.pdf
• ISSN: 1823-4690

This paper presents the detailed study on the measurement of low pressure sensor using double boss sculptured diaphragm of piezoresistive type with MEMS technology in flash flood level measurement. The MEMS based very thin diaphragms to sense the low pressure is analyzed by introducing supports to achieve linearity. The simulation results obtained from Intellisuite MEMS CAD design tool show that very thin diaphragms with rigid centre or boss give acceptable linearity. Further investigations on very thin diaphragms embedded with piezoresistor for low pressure measurement show that it is essential to analyse the piezoresistor placement and size of piezoresistor to achieve good sensitivity. A modified analytical modelling developed in this study for double boss sculptured diaphragm results were compared with simulated results. Further the enhancement of sensitivity is analyzed using non uniform thickness diaphragm and Silicon-On-Insulator (SOI) technique. The simulation results indicate that the double boss square sculptured diaphragm with SOI layer using 0.85μm thickness yields the higher voltage sensitivity, acceptable linearity with Small Scale Deflection.