Trace Ratio Criterion Based Large Margin Subspace Learning for Feature Selection
In this paper, we propose a novel feature selection model based on subspace learning with the use of a large margin principle. First, we present a new margin metric described by a given instance and its nearest missing and nearest hit, which can be explained as the nearest neighbor with a different...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8584439/ |