Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
Abstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance...
Main Authors: | , , , , , , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
SpringerOpen
2019-05-01
|
Series: | Nanoscale Research Letters |
Subjects: | |
Online Access: | http://link.springer.com/article/10.1186/s11671-019-3009-8 |
id |
doaj-f4c6b6559b8943718e930357ac8c49f4 |
---|---|
record_format |
Article |
spelling |
doaj-f4c6b6559b8943718e930357ac8c49f42020-11-25T03:34:08ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2019-05-0114111010.1186/s11671-019-3009-8Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical MeasurementsEduard Mikayelyan0Linda Grodd1Viachaslau Ksianzou2Daniel Wesner3Alexander I. Rodygin4Holger Schönherr5Yuriy N. Luponosov6Sergei A. Ponomarenko7Dimitri A. Ivanov8Ullrich Pietsch9Souren Grigorian10Department of Physics, University of SiegenDepartment of Physics, University of SiegenDepartment of Engineering and Natural Sciences, Technical University of Applied Sciences WildauPhysical Chemistry I, Department of Chemistry and Biology & Research Center of Micro and Nanochemistry and Engineering (Cμ), University of SiegenFaculty of Fundamental Physical and Chemical Engineering, Lomonosov Moscow State UniversityPhysical Chemistry I, Department of Chemistry and Biology & Research Center of Micro and Nanochemistry and Engineering (Cμ), University of SiegenEnikolopov Institute of Synthetic Polymeric Materials of Russian Academy of SciencesEnikolopov Institute of Synthetic Polymeric Materials of Russian Academy of SciencesFaculty of Fundamental Physical and Chemical Engineering, Lomonosov Moscow State UniversityDepartment of Physics, University of SiegenDepartment of Physics, University of SiegenAbstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry.http://link.springer.com/article/10.1186/s11671-019-3009-8Thin filmsInterfacial monolayersOligomersQuarterthiophenesIn situ GIXDPhase transitions |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Eduard Mikayelyan Linda Grodd Viachaslau Ksianzou Daniel Wesner Alexander I. Rodygin Holger Schönherr Yuriy N. Luponosov Sergei A. Ponomarenko Dimitri A. Ivanov Ullrich Pietsch Souren Grigorian |
spellingShingle |
Eduard Mikayelyan Linda Grodd Viachaslau Ksianzou Daniel Wesner Alexander I. Rodygin Holger Schönherr Yuriy N. Luponosov Sergei A. Ponomarenko Dimitri A. Ivanov Ullrich Pietsch Souren Grigorian Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements Nanoscale Research Letters Thin films Interfacial monolayers Oligomers Quarterthiophenes In situ GIXD Phase transitions |
author_facet |
Eduard Mikayelyan Linda Grodd Viachaslau Ksianzou Daniel Wesner Alexander I. Rodygin Holger Schönherr Yuriy N. Luponosov Sergei A. Ponomarenko Dimitri A. Ivanov Ullrich Pietsch Souren Grigorian |
author_sort |
Eduard Mikayelyan |
title |
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_short |
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_full |
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_fullStr |
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_full_unstemmed |
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements |
title_sort |
phase transitions and formation of a monolayer-type structure in thin oligothiophene films: exploration with a combined in situ x-ray diffraction and electrical measurements |
publisher |
SpringerOpen |
series |
Nanoscale Research Letters |
issn |
1931-7573 1556-276X |
publishDate |
2019-05-01 |
description |
Abstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry. |
topic |
Thin films Interfacial monolayers Oligomers Quarterthiophenes In situ GIXD Phase transitions |
url |
http://link.springer.com/article/10.1186/s11671-019-3009-8 |
work_keys_str_mv |
AT eduardmikayelyan phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT lindagrodd phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT viachaslauksianzou phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT danielwesner phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT alexanderirodygin phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT holgerschonherr phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT yuriynluponosov phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT sergeiaponomarenko phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT dimitriaivanov phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT ullrichpietsch phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements AT sourengrigorian phasetransitionsandformationofamonolayertypestructureinthinoligothiophenefilmsexplorationwithacombinedinsituxraydiffractionandelectricalmeasurements |
_version_ |
1724560372161052672 |