Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

Abstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance...

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Main Authors: Eduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, Daniel Wesner, Alexander I. Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko, Dimitri A. Ivanov, Ullrich Pietsch, Souren Grigorian
Format: Article
Language:English
Published: SpringerOpen 2019-05-01
Series:Nanoscale Research Letters
Subjects:
Online Access:http://link.springer.com/article/10.1186/s11671-019-3009-8
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spelling doaj-f4c6b6559b8943718e930357ac8c49f42020-11-25T03:34:08ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2019-05-0114111010.1186/s11671-019-3009-8Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical MeasurementsEduard Mikayelyan0Linda Grodd1Viachaslau Ksianzou2Daniel Wesner3Alexander I. Rodygin4Holger Schönherr5Yuriy N. Luponosov6Sergei A. Ponomarenko7Dimitri A. Ivanov8Ullrich Pietsch9Souren Grigorian10Department of Physics, University of SiegenDepartment of Physics, University of SiegenDepartment of Engineering and Natural Sciences, Technical University of Applied Sciences WildauPhysical Chemistry I, Department of Chemistry and Biology & Research Center of Micro and Nanochemistry and Engineering (Cμ), University of SiegenFaculty of Fundamental Physical and Chemical Engineering, Lomonosov Moscow State UniversityPhysical Chemistry I, Department of Chemistry and Biology & Research Center of Micro and Nanochemistry and Engineering (Cμ), University of SiegenEnikolopov Institute of Synthetic Polymeric Materials of Russian Academy of SciencesEnikolopov Institute of Synthetic Polymeric Materials of Russian Academy of SciencesFaculty of Fundamental Physical and Chemical Engineering, Lomonosov Moscow State UniversityDepartment of Physics, University of SiegenDepartment of Physics, University of SiegenAbstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry.http://link.springer.com/article/10.1186/s11671-019-3009-8Thin filmsInterfacial monolayersOligomersQuarterthiophenesIn situ GIXDPhase transitions
collection DOAJ
language English
format Article
sources DOAJ
author Eduard Mikayelyan
Linda Grodd
Viachaslau Ksianzou
Daniel Wesner
Alexander I. Rodygin
Holger Schönherr
Yuriy N. Luponosov
Sergei A. Ponomarenko
Dimitri A. Ivanov
Ullrich Pietsch
Souren Grigorian
spellingShingle Eduard Mikayelyan
Linda Grodd
Viachaslau Ksianzou
Daniel Wesner
Alexander I. Rodygin
Holger Schönherr
Yuriy N. Luponosov
Sergei A. Ponomarenko
Dimitri A. Ivanov
Ullrich Pietsch
Souren Grigorian
Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
Nanoscale Research Letters
Thin films
Interfacial monolayers
Oligomers
Quarterthiophenes
In situ GIXD
Phase transitions
author_facet Eduard Mikayelyan
Linda Grodd
Viachaslau Ksianzou
Daniel Wesner
Alexander I. Rodygin
Holger Schönherr
Yuriy N. Luponosov
Sergei A. Ponomarenko
Dimitri A. Ivanov
Ullrich Pietsch
Souren Grigorian
author_sort Eduard Mikayelyan
title Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
title_short Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
title_full Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
title_fullStr Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
title_full_unstemmed Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements
title_sort phase transitions and formation of a monolayer-type structure in thin oligothiophene films: exploration with a combined in situ x-ray diffraction and electrical measurements
publisher SpringerOpen
series Nanoscale Research Letters
issn 1931-7573
1556-276X
publishDate 2019-05-01
description Abstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T). A transition from the initial highly crystalline phase to a mesophase was detected upon heating, while only a partial backward transition was observed upon cooling to room temperature. In situ electrical conductivity measurements revealed the impact of both transitions on charge transport. This is partly accounted for by the fact that the initial crystalline phase is characterized by inclination of molecules in the plane perpendicular to the π-π stacking direction, whereas the mesophase is built of molecules tilted in the direction of π-π stacking. Importantly, in addition to the two phases of DH4T characteristic of the bulk, a third interfacial substrate-stabilized monolayer-type phase was observed. The existence of such interfacial structure can have important implications for the charge mobility, being especially favorable for lateral two-dimensional charge transport in the organic field-effect transistors geometry.
topic Thin films
Interfacial monolayers
Oligomers
Quarterthiophenes
In situ GIXD
Phase transitions
url http://link.springer.com/article/10.1186/s11671-019-3009-8
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