Role of CoFeB thickness in electric field controlled sub-100 nm sized magnetic tunnel junctions

Role of CoFeB thickness in electric field controlled sub-100 nm sized magnetic tunnel junctions

We report a comprehensive study on the role of the free layer thickness (tF) in electric-field controlled nanoscale perpendicular magnetic tunnel junctions (MTJs), comprising of free layer structure Ta/Co40Fe40B20/MgO, by using dc magnetoresistance and ultra-short magnetization switching measurement...

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Bibliographic Details
Main Authors:	James Lourembam, Jiancheng Huang, Sze Ter Lim, Ernult Franck Gerard
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2018-05-01
Series:	AIP Advances
Online Access:	http://dx.doi.org/10.1063/1.5006368

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