Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs
Negative capacitance (NC) germanium (Ge) p-channel field effect transistors with different ferroelectric parameters are investigated by the analytical model. The channel surface potential amplification induced by the NC effect, which determines the subthreshold swing (SS) and the drain current I<...
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doaj-f212e50e0b4d46c3890633f3aa3116752021-03-29T18:45:59ZengIEEEIEEE Journal of the Electron Devices Society2168-67342018-01-01623323910.1109/JEDS.2018.27940698259272Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETsYue Peng0Genquan Han1https://orcid.org/0000-0001-5140-4150Zhibin Chen2Qinglong Li3Jincheng Zhang4https://orcid.org/0000-0001-7332-6704Yue Hao5State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaState Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaState Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaState Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaState Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaState Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, ChinaNegative capacitance (NC) germanium (Ge) p-channel field effect transistors with different ferroelectric parameters are investigated by the analytical model. The channel surface potential amplification induced by the NC effect, which determines the subthreshold swing (SS) and the drain current I<sub>DS</sub> of the device, can be tuned by varying the thickness t<sub>fe</sub>, the coercive field E<sub>c</sub>, and the remnant polarization P<sub>r</sub> of the ferroelectric film. For the logic device, hysteresis phenomenon must be avoided, which is enabled by reducing t<sub>fe</sub> or E<sub>c</sub> of the ferroelectric film. Under the condition of t<sub>fe</sub> = 30 nm, E<sub>c</sub> = 30 KV/cm, and P<sub>r</sub> = 30 μC/cm<sup>2</sup>, NC Ge transistors display the superior SS and I<sub>DS</sub> compared to the baseline FETs.https://ieeexplore.ieee.org/document/8259272/Negative capacitanceFETgermaniumferroelectrichysteresis |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Yue Peng Genquan Han Zhibin Chen Qinglong Li Jincheng Zhang Yue Hao |
spellingShingle |
Yue Peng Genquan Han Zhibin Chen Qinglong Li Jincheng Zhang Yue Hao Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs IEEE Journal of the Electron Devices Society Negative capacitance FET germanium ferroelectric hysteresis |
author_facet |
Yue Peng Genquan Han Zhibin Chen Qinglong Li Jincheng Zhang Yue Hao |
author_sort |
Yue Peng |
title |
Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs |
title_short |
Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs |
title_full |
Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs |
title_fullStr |
Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs |
title_full_unstemmed |
Analytical Calculation of Influence of Ferroelectric Properties on Electrical Characteristics Negative Capacitance Germanium FETs |
title_sort |
analytical calculation of influence of ferroelectric properties on electrical characteristics negative capacitance germanium fets |
publisher |
IEEE |
series |
IEEE Journal of the Electron Devices Society |
issn |
2168-6734 |
publishDate |
2018-01-01 |
description |
Negative capacitance (NC) germanium (Ge) p-channel field effect transistors with different ferroelectric parameters are investigated by the analytical model. The channel surface potential amplification induced by the NC effect, which determines the subthreshold swing (SS) and the drain current I<sub>DS</sub> of the device, can be tuned by varying the thickness t<sub>fe</sub>, the coercive field E<sub>c</sub>, and the remnant polarization P<sub>r</sub> of the ferroelectric film. For the logic device, hysteresis phenomenon must be avoided, which is enabled by reducing t<sub>fe</sub> or E<sub>c</sub> of the ferroelectric film. Under the condition of t<sub>fe</sub> = 30 nm, E<sub>c</sub> = 30 KV/cm, and P<sub>r</sub> = 30 μC/cm<sup>2</sup>, NC Ge transistors display the superior SS and I<sub>DS</sub> compared to the baseline FETs. |
topic |
Negative capacitance FET germanium ferroelectric hysteresis |
url |
https://ieeexplore.ieee.org/document/8259272/ |
work_keys_str_mv |
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1724196553440100352 |