A 30+ Year AVHRR Land Surface Reflectance Climate Data Record and Its Application to Wheat Yield Monitoring

A 30+ Year AVHRR Land Surface Reflectance Climate Data Record and Its Application to Wheat Yield Monitoring

The Advanced Very High Resolution Radiometer (AVHRR) sensor provides a unique global remote sensing dataset that ranges from the 1980s to the present. Over the years, several efforts have been made on the calibration of the different instruments to establish a consistent land surface reflectance tim...

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Bibliographic Details
Main Authors: Belen Franch, Eric F. Vermote, Jean-Claude Roger, Emilie Murphy, Inbal Becker-Reshef, Chris Justice, Martin Claverie, Jyoteshwar Nagol, Ivan Csiszar, Dave Meyer, Frederic Baret, Edward Masuoka, Robert Wolfe, Sadashiva Devadiga
Format: Article
Language:English
Published: MDPI AG 2017-03-01
Series:Remote Sensing
Subjects:
AVHRR
LCDR
MODIS
surface reflectance
yield monitoring
Online Access:http://www.mdpi.com/2072-4292/9/3/296

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