Analysis of Work-Function Variation Effects in a Tunnel Field-Effect Transistor Depending on the Device Structure

Metal gate technology is one of the most important methods used to increase the low on-current of tunnel field-effect transistors (TFETs). However, metal gates have different work-functions for each grain during the deposition process, resulting in work-function variation (WFV) effects, which means...

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Bibliographic Details
Main Authors: Garam Kim, Jang Hyun Kim, Jaemin Kim, Sangwan Kim
Format: Article
Language:English
Published: MDPI AG 2020-08-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/10/15/5378

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