Analysis of Work-Function Variation Effects in a Tunnel Field-Effect Transistor Depending on the Device Structure
Metal gate technology is one of the most important methods used to increase the low on-current of tunnel field-effect transistors (TFETs). However, metal gates have different work-functions for each grain during the deposition process, resulting in work-function variation (WFV) effects, which means...
Main Authors: | Garam Kim, Jang Hyun Kim, Jaemin Kim, Sangwan Kim |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-08-01
|
Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/10/15/5378 |
Similar Items
-
Methodology to Investigate Impact of Grain Orientation on Threshold Voltage and Current Variability in Tunneling Field-Effect Transistors
by: Jang Hyun Kim, et al.
Published: (2020-01-01) -
Analysis of Current Variation with Work Function Variation in L-Shaped Tunnel-Field Effect Transistor
by: Jang Hyun Kim, et al.
Published: (2020-08-01) -
High On-Current Ge-Channel Heterojunction Tunnel Field-Effect Transistor Using Direct Band-to-Band Tunneling
by: Garam Kim, et al.
Published: (2019-01-01) -
F-Shaped Tunnel Field-Effect Transistor (TFET) for the Low-Power Application
by: Seunghyun Yun, et al.
Published: (2019-11-01) -
Built-In Sheet Charge As an Alternative to Dopant Pockets in Tunnel Field-Effect Transistors`
by: Devin Verreck, et al.
Published: (2018-01-01)