Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition

Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition

A series of ultrathin InSb films grown on GaAs by low-pressure metalorganic chemical vapor deposition with different V/III ratios were investigated thoroughly using spectroscopic ellipsometry (SE), X-ray diffraction, and synchrotron radiation X-ray absorption spectroscopy. The results predicted that...

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Bibliographic Details
Main Authors: Yingda Qian, Yuanlan Liang, Xuguang Luo, Kaiyan He, Wenhong Sun, Hao-Hsiung Lin, Devki N. Talwar, Ting-Shan Chan, Ian Ferguson, Lingyu Wan, Qingyi Yang, Zhe Chuan Feng
Format: Article
Language:English
Published: Hindawi Limited 2018-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2018/5016435

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