The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films

  In this investigation, Ag-SiO2 thin films with different concentrations of Ag (0.2, 0.4, 1.6 and 8%) has been fabricated on soda-lime glass substrate using sol-gel method. After an annealing process, physical and chemical properties of the deposited silica films containing Ag nanoparticles have be...

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Main Authors: A Babapour, L Samii, O Akhavan, A R Moshfegh
Format: Article
Language:English
Published: Isfahan University of Technology 2007-12-01
Series:Iranian Journal of Physics Research
Subjects:
Online Access:http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-355&slc_lang=en&sid=1
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spelling doaj-ef4962d385154c11bc83b1e7724eb7a42020-11-24T23:35:25ZengIsfahan University of TechnologyIranian Journal of Physics Research1682-69572007-12-0174213218The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin filmsA BabapourL SamiiO AkhavanA R Moshfegh  In this investigation, Ag-SiO2 thin films with different concentrations of Ag (0.2, 0.4, 1.6 and 8%) has been fabricated on soda-lime glass substrate using sol-gel method. After an annealing process, physical and chemical properties of the deposited silica films containing Ag nanoparticles have been studied including optical, topographical structural, morphological and size of the nanoparticle as well as their distribution using UV-visble spectrophotometery, atomic force microscopy (AFM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) techniques, respectively. Based on our data analysis, the Ag nanoparticles did not form in the samples with low (0.2%) and high Ag concentrations (8%), without any suitable annealing process. Instead, the nanoparticles were formed easily for the intermediate Ag concentrations. In fact, for the the low and high Ag concentration, the Ag nanoparticles formed at the annealing temperature of 200 º C. In addition, according to TEM observations, the minimum average size of the synthesized particles were determined about 4 hm for the thin films containing 0.2% Ag concentration. http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-355&slc_lang=en&sid=1nanoparticlessol-gel methodAg-SiO2 thin films
collection DOAJ
language English
format Article
sources DOAJ
author A Babapour
L Samii
O Akhavan
A R Moshfegh
spellingShingle A Babapour
L Samii
O Akhavan
A R Moshfegh
The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
Iranian Journal of Physics Research
nanoparticles
sol-gel method
Ag-SiO2 thin films
author_facet A Babapour
L Samii
O Akhavan
A R Moshfegh
author_sort A Babapour
title The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
title_short The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
title_full The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
title_fullStr The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
title_full_unstemmed The effect of AgNO3 concentration on formation of Ag nanoparticles in Sol-Gel derived Ag-SiO2 thin films
title_sort effect of agno3 concentration on formation of ag nanoparticles in sol-gel derived ag-sio2 thin films
publisher Isfahan University of Technology
series Iranian Journal of Physics Research
issn 1682-6957
publishDate 2007-12-01
description   In this investigation, Ag-SiO2 thin films with different concentrations of Ag (0.2, 0.4, 1.6 and 8%) has been fabricated on soda-lime glass substrate using sol-gel method. After an annealing process, physical and chemical properties of the deposited silica films containing Ag nanoparticles have been studied including optical, topographical structural, morphological and size of the nanoparticle as well as their distribution using UV-visble spectrophotometery, atomic force microscopy (AFM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) techniques, respectively. Based on our data analysis, the Ag nanoparticles did not form in the samples with low (0.2%) and high Ag concentrations (8%), without any suitable annealing process. Instead, the nanoparticles were formed easily for the intermediate Ag concentrations. In fact, for the the low and high Ag concentration, the Ag nanoparticles formed at the annealing temperature of 200 º C. In addition, according to TEM observations, the minimum average size of the synthesized particles were determined about 4 hm for the thin films containing 0.2% Ag concentration.
topic nanoparticles
sol-gel method
Ag-SiO2 thin films
url http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-355&slc_lang=en&sid=1
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