Temperature-Aware Floorplanning for Fixed-Outline 3D ICs

Thermal characteristics have been considered as one of the most challenging problems in 3D integrated circuits (3D ICs). The vertically stacked multiple layers of active devices cause a rapid increase of power density and the thermal conductivity of the dielectric layers inserted between device laye...

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Main Authors: Tianming Ni, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8846032/
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spelling doaj-ed11f247ca2a417ca43d136c9cf2a7632021-03-29T23:13:01ZengIEEEIEEE Access2169-35362019-01-01713978713979410.1109/ACCESS.2019.29428398846032Temperature-Aware Floorplanning for Fixed-Outline 3D ICsTianming Ni0https://orcid.org/0000-0001-6272-8660Hao Chang1Shidong Zhu2Lin Lu3Xueyun Li4Qi Xu5Huaguo Liang6Zhengfeng Huang7College of Electrical Engineering, Anhui Polytechnic University, Wuhu, ChinaDepartment of Computer Science and Technology, Anhui University of Finance and Economics, Bengbu, ChinaCollege of Electrical Engineering, Anhui Polytechnic University, Wuhu, ChinaCollege of Electrical Engineering, Anhui Polytechnic University, Wuhu, ChinaSchool of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, ChinaSchool of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, ChinaSchool of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, ChinaSchool of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, ChinaThermal characteristics have been considered as one of the most challenging problems in 3D integrated circuits (3D ICs). The vertically stacked multiple layers of active devices cause a rapid increase of power density and the thermal conductivity of the dielectric layers inserted between device layers for insulation is quite low compared to silicon and metal, which make the peak temperature of 3D ICs rise, leading to the performance degradation. In this paper, instead of inserting Thermal Through Silicon Vias (TTSVs) to reduce the peak temperature, a temperature-aware floorplanning algorithm based on simulated annealing for fixed-outline 3D IC is proposed. The concept of “hot” block is given, by placing the “hot” block of the 3D IC on the bottom layer of the chip (near the radiator) and reasonable intra-layer and inter-layer heat limitation, the peak temperature of the 3D IC is minimized. The number, area and wirelength of the TSVs are also considered in this paper. The results show that the proposed temperature-aware 3D IC floorplanning can effectively reduce the chip peak temperature and the number of TSVs with reasonable area, wirelength and time overhead.https://ieeexplore.ieee.org/document/8846032/3D IC“hot” blocktemperature-awarefloorplanning
collection DOAJ
language English
format Article
sources DOAJ
author Tianming Ni
Hao Chang
Shidong Zhu
Lin Lu
Xueyun Li
Qi Xu
Huaguo Liang
Zhengfeng Huang
spellingShingle Tianming Ni
Hao Chang
Shidong Zhu
Lin Lu
Xueyun Li
Qi Xu
Huaguo Liang
Zhengfeng Huang
Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
IEEE Access
3D IC
“hot” block
temperature-aware
floorplanning
author_facet Tianming Ni
Hao Chang
Shidong Zhu
Lin Lu
Xueyun Li
Qi Xu
Huaguo Liang
Zhengfeng Huang
author_sort Tianming Ni
title Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
title_short Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
title_full Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
title_fullStr Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
title_full_unstemmed Temperature-Aware Floorplanning for Fixed-Outline 3D ICs
title_sort temperature-aware floorplanning for fixed-outline 3d ics
publisher IEEE
series IEEE Access
issn 2169-3536
publishDate 2019-01-01
description Thermal characteristics have been considered as one of the most challenging problems in 3D integrated circuits (3D ICs). The vertically stacked multiple layers of active devices cause a rapid increase of power density and the thermal conductivity of the dielectric layers inserted between device layers for insulation is quite low compared to silicon and metal, which make the peak temperature of 3D ICs rise, leading to the performance degradation. In this paper, instead of inserting Thermal Through Silicon Vias (TTSVs) to reduce the peak temperature, a temperature-aware floorplanning algorithm based on simulated annealing for fixed-outline 3D IC is proposed. The concept of “hot” block is given, by placing the “hot” block of the 3D IC on the bottom layer of the chip (near the radiator) and reasonable intra-layer and inter-layer heat limitation, the peak temperature of the 3D IC is minimized. The number, area and wirelength of the TSVs are also considered in this paper. The results show that the proposed temperature-aware 3D IC floorplanning can effectively reduce the chip peak temperature and the number of TSVs with reasonable area, wirelength and time overhead.
topic 3D IC
“hot” block
temperature-aware
floorplanning
url https://ieeexplore.ieee.org/document/8846032/
work_keys_str_mv AT tianmingni temperatureawarefloorplanningforfixedoutline3dics
AT haochang temperatureawarefloorplanningforfixedoutline3dics
AT shidongzhu temperatureawarefloorplanningforfixedoutline3dics
AT linlu temperatureawarefloorplanningforfixedoutline3dics
AT xueyunli temperatureawarefloorplanningforfixedoutline3dics
AT qixu temperatureawarefloorplanningforfixedoutline3dics
AT huaguoliang temperatureawarefloorplanningforfixedoutline3dics
AT zhengfenghuang temperatureawarefloorplanningforfixedoutline3dics
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