Stochastic stimulated electronic x-ray Raman spectroscopy
Resonant inelastic x-ray scattering (RIXS) is a well-established tool for studying electronic, nuclear, and collective dynamics of excited atoms, molecules, and solids. An extension of this powerful method to a time-resolved probe technique at x-ray free electron lasers (XFELs) to ultimately unravel...
Main Authors: | Victor Kimberg, Nina Rohringer |
---|---|
Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC and ACA
2016-05-01
|
Series: | Structural Dynamics |
Online Access: | http://dx.doi.org/10.1063/1.4940916 |
Similar Items
-
High Temporal and Spectral Resolution of Stimulated X-Ray Raman Signals with Stochastic Free-Electron-Laser Pulses
by: Stefano M. Cavaletto, et al.
Published: (2021-02-01) -
Spontaneous and stimulated X-ray Raman scattering
by: Sun, Yu-Ping
Published: (2011) -
Monitoring conical intersections in the ring opening of furan by attosecond stimulated X-ray Raman spectroscopy
by: Weijie Hua, et al.
Published: (2016-03-01) -
Resonant X-ray emission spectroscopy from broadband stochastic pulses at an X-ray free electron laser
by: Franklin D. Fuller, et al.
Published: (2021-06-01) -
Two-dimensional electronic femtosecond stimulated Raman spectroscopy
by: Ogilvie J.P., et al.
Published: (2013-03-01)