X-ray Photoelectron Spectroscopy in Mineral Processing Studies

• Main Author: Yuri Mikhlin
• Format: Article
• Language: English
• Published: MDPI AG 2020-07-01
• Series: Applied Sciences
• Subjects: X-ray photoelectron spectroscopy; sulfide minerals; surface; oxidation; flotation; leaching
• Online Access: https://www.mdpi.com/2076-3417/10/15/5138

Surface phenomena play the crucial role in the behavior of sulfide minerals in mineral processing of base and precious metal ores, including flotation, leaching, and environmental concerns. X-ray photoelectron spectroscopy (XPS) is the main experimental technique for surface characterization at present. However, there exist a number of problems related with complex composition of natural mineral systems, and instability of surface species and mineral/aqueous phase interfaces in the spectrometer vacuum. This overview describes contemporary XPS methods in terms of categorization and quantitative analysis of oxidation products, adsorbates and non-stoichiometric layers of sulfide phases, depth and lateral spatial resolution for minerals and ores under conditions related to mineral processing and hydrometallurgy. Specific practices allowing to preserve volatile species, e.g., elemental sulfur, polysulfide anions and flotation collectors, as well as solid/liquid interfaces are surveyed; in particular, the prospects of ambient pressure XPS and cryo-XPS of fast-frozen wet mineral pastes are discussed. It is also emphasized that further insights into the surface characteristics of individual minerals in technological slurries need new protocols of sample preparation in conjunction with high spatial resolution photoelectron spectroscopy that is still unavailable or unutilized in practice.