Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMV...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2016-01-01
|
| Series: | Journal of Sensors |
| Online Access: | http://dx.doi.org/10.1155/2016/9604042 |