Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage

The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMV...

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Main Authors:	Zujun Wang, Baoping He, Wuying Ma, Zhibin Yao, Shaoyan Huang, Minbo Liu, Jiangkun Sheng
Format:	Article
Language:	English
Published:	Hindawi Limited 2016-01-01
Series:	Journal of Sensors
Online Access:	http://dx.doi.org/10.1155/2016/9604042

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record_format	Article
spelling	doaj-ebd18b5488df4b169d25136f8afbf3bb2020-11-24T22:39:24ZengHindawi LimitedJournal of Sensors1687-725X1687-72682016-01-01201610.1155/2016/96040429604042Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation DamageZujun Wang0Baoping He1Wuying Ma2Zhibin Yao3Shaoyan Huang4Minbo Liu5Jiangkun Sheng6State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaState Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. Box 69-10, Xi’an 710024, ChinaThe evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.http://dx.doi.org/10.1155/2016/9604042
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Zujun Wang Baoping He Wuying Ma Zhibin Yao Shaoyan Huang Minbo Liu Jiangkun Sheng
spellingShingle	Zujun Wang Baoping He Wuying Ma Zhibin Yao Shaoyan Huang Minbo Liu Jiangkun Sheng Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage Journal of Sensors
author_facet	Zujun Wang Baoping He Wuying Ma Zhibin Yao Shaoyan Huang Minbo Liu Jiangkun Sheng
author_sort	Zujun Wang
title	Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
title_short	Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
title_full	Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
title_fullStr	Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
title_full_unstemmed	Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
title_sort	evaluation of the degradation on a cots linear ccd induced by total ionizing dose radiation damage
publisher	Hindawi Limited
series	Journal of Sensors
issn	1687-725X 1687-7268
publishDate	2016-01-01
description	The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.
url	http://dx.doi.org/10.1155/2016/9604042
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Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage

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