Test Stimuli Segmentation and Coding Method

Test vector coding and data transmission are the key technologies in the design-for-test of digital integrated circuits (IC). Existing parallel input methods of test stimuli can reduce test application times; however, they need to occupy multiple input ports. Thus, a novel method of test stimuli cod...

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Main Authors: Yuxiang Chen, Chuandong Chen, Haibo Luo
Format: Article
Language:English
Published: Faculty of Mechanical Engineering in Slavonski Brod, Faculty of Electrical Engineering in Osijek, Faculty of Civil Engineering in Osijek 2018-01-01
Series:Tehnički Vjesnik
Subjects:
Online Access:https://hrcak.srce.hr/file/300942
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spelling doaj-ebb6fd1a12504eee90ce82067d75fd672020-11-25T00:16:05ZengFaculty of Mechanical Engineering in Slavonski Brod, Faculty of Electrical Engineering in Osijek, Faculty of Civil Engineering in Osijek Tehnički Vjesnik1330-36511848-63392018-01-0125411441153Test Stimuli Segmentation and Coding MethodYuxiang Chen0Chuandong Chen1Haibo Luo2Division of Physical Sciences, The University of Chicago, 5640 South Ellis Avenue, Chicago, IL, United StatesDepartment of Microelectronics, Fuzhou University, 2 Xue Yuan Road, University Town, Fuzhou, Fujian Province, ChinaElectronic Information and Control of Fujian, University Engineering Research Center, Minjiang University, 200 Xi Yuan Gong Road, University Town, Fuzhou, Fujian Province, ChinaTest vector coding and data transmission are the key technologies in the design-for-test of digital integrated circuits (IC). Existing parallel input methods of test stimuli can reduce test application times; however, they need to occupy multiple input ports. Thus, a novel method of test stimuli coding and data transmission was proposed to reduce the test application time of the test vectors and reduce the number of input ports required for the parallel input of test stimuli. This method was based on the segmentation of test stimuli. First, the test stimuli were evenly segmented into eight-bit wide. Second, the eight-bit data of each segment were encoded to the five-bit data according to the compatibility between the test data of each segment. The eight-bit test stimuli input can be completed in one or two clock cycles of automatic test equipment (ATE) by using the five input ports of the chip. The corresponding decoding circuit was added inside the netlist of the circuit to realize the rapid input of the test stimuli. Lastly, the ISCAS'89 benchmark circuit was used to conduct experiments, results of this coding method were then compared with those of the serial input method. Results show that the encoding method proposed in this study can save an average of 37% of the parallel input data width and 81.7% of the test stimuli input time. The proposed method in this study can also reduce the test application time and the cost of the IC test. The findings of this study can provide guidance for improving the scan testing method of digital IC.https://hrcak.srce.hr/file/300942design-for-testscan testingtest stimulitest vectors
collection DOAJ
language English
format Article
sources DOAJ
author Yuxiang Chen
Chuandong Chen
Haibo Luo
spellingShingle Yuxiang Chen
Chuandong Chen
Haibo Luo
Test Stimuli Segmentation and Coding Method
Tehnički Vjesnik
design-for-test
scan testing
test stimuli
test vectors
author_facet Yuxiang Chen
Chuandong Chen
Haibo Luo
author_sort Yuxiang Chen
title Test Stimuli Segmentation and Coding Method
title_short Test Stimuli Segmentation and Coding Method
title_full Test Stimuli Segmentation and Coding Method
title_fullStr Test Stimuli Segmentation and Coding Method
title_full_unstemmed Test Stimuli Segmentation and Coding Method
title_sort test stimuli segmentation and coding method
publisher Faculty of Mechanical Engineering in Slavonski Brod, Faculty of Electrical Engineering in Osijek, Faculty of Civil Engineering in Osijek
series Tehnički Vjesnik
issn 1330-3651
1848-6339
publishDate 2018-01-01
description Test vector coding and data transmission are the key technologies in the design-for-test of digital integrated circuits (IC). Existing parallel input methods of test stimuli can reduce test application times; however, they need to occupy multiple input ports. Thus, a novel method of test stimuli coding and data transmission was proposed to reduce the test application time of the test vectors and reduce the number of input ports required for the parallel input of test stimuli. This method was based on the segmentation of test stimuli. First, the test stimuli were evenly segmented into eight-bit wide. Second, the eight-bit data of each segment were encoded to the five-bit data according to the compatibility between the test data of each segment. The eight-bit test stimuli input can be completed in one or two clock cycles of automatic test equipment (ATE) by using the five input ports of the chip. The corresponding decoding circuit was added inside the netlist of the circuit to realize the rapid input of the test stimuli. Lastly, the ISCAS'89 benchmark circuit was used to conduct experiments, results of this coding method were then compared with those of the serial input method. Results show that the encoding method proposed in this study can save an average of 37% of the parallel input data width and 81.7% of the test stimuli input time. The proposed method in this study can also reduce the test application time and the cost of the IC test. The findings of this study can provide guidance for improving the scan testing method of digital IC.
topic design-for-test
scan testing
test stimuli
test vectors
url https://hrcak.srce.hr/file/300942
work_keys_str_mv AT yuxiangchen teststimulisegmentationandcodingmethod
AT chuandongchen teststimulisegmentationandcodingmethod
AT haiboluo teststimulisegmentationandcodingmethod
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