Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

Abstract Background CUT&RUN is an efficient epigenome profiling method that identifies sites of DNA binding protein enrichment genome-wide with high signal to noise and low sequencing requirements. Currently, the analysis of CUT&RUN data is complicated by its exceptionally low background, wh...

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Bibliographic Details
Main Authors: Michael P. Meers, Dan Tenenbaum, Steven Henikoff
Format: Article
Language:English
Published: BMC 2019-07-01
Series:Epigenetics & Chromatin
Subjects:
CUT&RUN
Epigenome profiling
Peak calling
Online Access:http://link.springer.com/article/10.1186/s13072-019-0287-4

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