A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip

• Main Authors: Hui Li, Feiyang Liu, Huaxi Gu, Zhuqin Chu, Xiaochun Ye
• Format: Article
• Language: English
• Published: IEEE 2020-01-01
• Series: IEEE Access
• Subjects: Silicon photonic interconnects on chip; design method; reliability; application mapping; wavelength assignment
• Online Access: https://ieeexplore.ieee.org/document/9066846/

Silicon photonic interconnects on chip is an emerging technology for future ultra-scale and data-intensive computing chips, e.g., many-core processors, owing to its high transmission speed and low latency. However, in the Wavelength Division Multiplexing (WDM)-based architecture, the communication reliability can be significantly affected by the signal losses and crosstalk, due to the inherent characteristic of photonic devices. This paper studies the influence on reliability of managing application mapping and wavelength assignment separately. To deal with this issue, we propose a reliability-aware joint design method coordinating application mapping and wavelength assignment schemes. For a given application core graph and a network architecture, the design method can obtain a result of application mapping and wavelength assignment with improved reliability, compared to the separate scheme. According to the evaluation of Optical Signal-to-Noise Ratio (OSNR), the proposed method enables more reliable communication under given applications.