Optical and Magnetooptical Spectroscopy of the Nanostructural Multilayered Films: Possible Applications

• Main Author: Yu. V. Kudryavtsev, V. M. Uvarov, R. Gontarz, J. Dubowik, Y. P. Lee, J. Y. Rhee, Yu. N. Makogon, E. P. Pavlova
• Format: Article
• Language: English
• Published: G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine 2005-06-01
• Series: Успехи физики металлов
• Online Access: https://doi.org/10.15407/ufm.06.02.135

The aim of the paper is to show the potential of the spectroscopic ellipsometry and magnetooptical (MO) spectroscopy for probing of the multilayered films (MLF) with sublayer thickness of about a few nanometres. The main approach applied by us is based on the comparison of the experimental optical and MO properties with the simulated ones based on various models of the MLF. Specifically, as shown, such an approach can be useful for studying the nature of unusual MO properties and the interfaces in MLF comprising the noble and 3d-transition metals (3d-TM). The high sensitivity of the applied spectroscopic methods for the monitoring of the solid-state reactions in the 3d-TM/Si MLF induced by ion-beam treatment or by thermal annealing is also demonstrated. The optical properties of various silicides formed spontaneously or induced by various treatments at interfaces are evaluated experimentally and compared with the results of first-principle calculations.