Simulation-Based System-Level Conducted Susceptibility Testing Method and Application to the Evaluation of Conducted-Noise Filters

• Main Authors: Junho Joo, Sang Il Kwak, Jong Hwa Kwon, Eakhwan Song
• Format: Article
• Language: English
• Published: MDPI AG 2019-08-01
• Series: Electronics
• Subjects: conducted susceptibility; simulation-based testing; wireless power transfer
• Online Access: https://www.mdpi.com/2079-9292/8/8/908

In this paper, a simulation-based system-level conducted susceptibility (CS) testing method for a wireless power transfer (WPT) system is proposed. The proposed method employs 3-dimensional electromagnetic (3D EM) models as well as equivalent circuit models to replace the measurement-based CS testing method based on the International Electrotechnical Commission 61000-4-6 standard. The conducted-noise source and equipment under test (EUT) are modeled in a circuit simulator. The conduction path, bulk current injection probe, and calibration jig are modeled using the 3D field simulator. A simple WPT system is designed and fabricated as the EUT for the CS test. The proposed method is successfully verified by comparing the voltage waveforms with measurement-based CS testing method. Additionally, as an application of the proposed method, a simulation-based evaluation of the conducted-noise filters is conducted. By using the proposed method, it is expected that the time and cost expense of setting up the test setup, as well as the testing procedure for the conventional measurement-based CS testing, will be drastically reduced. In addition, the proposed method can be used to estimate the conducted immunity of a system in the early stage of the design cycle prior to production.