In Situ Measurement of Polymer Layer Thickness in Porous Layer Open Tubular (PLOT) Columns Using Optical Absorbance in the Near-IR Range

Highly reproducible fabrication of porous layer open tubular (PLOT) structures in fused silica capillaries is often challenging; thus, methods to measure layer thickness growth in real time represent a powerful tool for the production of such columns. The work presented herein demonstrates the appli...

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Bibliographic Details
Main Authors: David Collins, Ekaterina Nesterenko, Brett Paull
Format: Article
Language:English
Published: MDPI AG 2016-12-01
Series:Separations
Subjects:
Online Access:http://www.mdpi.com/2297-8739/3/4/34
Description
Summary:Highly reproducible fabrication of porous layer open tubular (PLOT) structures in fused silica capillaries is often challenging; thus, methods to measure layer thickness growth in real time represent a powerful tool for the production of such columns. The work presented herein demonstrates the application of optical absorbance in the near-infrared (near IR) range for the in-process measurement of polymer layer growth inside fused silica capillaries during the fabrication of PLOT columns. The proposed technique can be used for both on- and off-line measurements of layer thickness for thermal- and photo- initiated polymerisation methods, performed in either polytetrafluoroethylene (PTFE)- or polyimide-coated capillaries. Measurements of layer thickness were carried out at λ 700 nm, using 100 μm and 8 μm optical fibres, yielding relative standard deviation (%RSD) values of 27% and 22%, respectively.
ISSN:2297-8739