Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements
In this study, we present the comparison of device performance measurements for organic light emitting diodes using a spectroradiometer through the viewing angle and integrating sphere, widely used for device measurements. The mean calculation method using these results was applied to convert the sp...
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doaj-e7a40336513846e4814e707f7da67a2b2020-11-25T03:59:05ZengAIP Publishing LLCAIP Advances2158-32262020-09-01109095011095011-710.1063/5.0013324Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurementsWon Ho Lee0P. Justin Jesuraj1Hassan Hafeez2Dong Hyun Kim3Chang Min Lee4Sang Hee Won5Sung Tae Shin6Sanghyuk Park7Tae-Sung Bae8Seung Min Yu9Myungkwan Song10Chang-Su Kim11Seung Yoon Ryu12Division of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaDepartment of Chemistry, Kongju National University, 56 Gongjudaehak-ro, Gongju, Chungnam 32588, South KoreaJeonju Center, Korea Basic Science Institute (KBSI), 20, Geonji-ro, Deokjin-gu, Jeonju, Jeollabuk-do 54907, South KoreaJeonju Center, Korea Basic Science Institute (KBSI), 20, Geonji-ro, Deokjin-gu, Jeonju, Jeollabuk-do 54907, South KoreaSurface Technology Division, Korea Institute of Materials Science (KIMS), Changwon 51508, South KoreaSurface Technology Division, Korea Institute of Materials Science (KIMS), Changwon 51508, South KoreaDivision of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong, Campus 2511 Sejong-ro, Sejong City 30019, South KoreaIn this study, we present the comparison of device performance measurements for organic light emitting diodes using a spectroradiometer through the viewing angle and integrating sphere, widely used for device measurements. The mean calculation method using these results was applied to convert the spectroradiometer (under different viewing angles) data to match with the integrating sphere measurements. The conversion of the spectroradiometer based quantum efficiency and electroluminescence data from all different angular emission patterns was similar to that of the integrating sphere data within a reasonable range of deviation. As such, it is possible to reduce the recurring costs and required time between these two measurement techniques by bypassing the integrating sphere measurement.http://dx.doi.org/10.1063/5.0013324 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Won Ho Lee P. Justin Jesuraj Hassan Hafeez Dong Hyun Kim Chang Min Lee Sang Hee Won Sung Tae Shin Sanghyuk Park Tae-Sung Bae Seung Min Yu Myungkwan Song Chang-Su Kim Seung Yoon Ryu |
spellingShingle |
Won Ho Lee P. Justin Jesuraj Hassan Hafeez Dong Hyun Kim Chang Min Lee Sang Hee Won Sung Tae Shin Sanghyuk Park Tae-Sung Bae Seung Min Yu Myungkwan Song Chang-Su Kim Seung Yoon Ryu Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements AIP Advances |
author_facet |
Won Ho Lee P. Justin Jesuraj Hassan Hafeez Dong Hyun Kim Chang Min Lee Sang Hee Won Sung Tae Shin Sanghyuk Park Tae-Sung Bae Seung Min Yu Myungkwan Song Chang-Su Kim Seung Yoon Ryu |
author_sort |
Won Ho Lee |
title |
Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
title_short |
Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
title_full |
Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
title_fullStr |
Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
title_full_unstemmed |
Comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
title_sort |
comparison of organic light emitting diode performance using the spectroradiometer and the integrating sphere measurements |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2020-09-01 |
description |
In this study, we present the comparison of device performance measurements for organic light emitting diodes using a spectroradiometer through the viewing angle and integrating sphere, widely used for device measurements. The mean calculation method using these results was applied to convert the spectroradiometer (under different viewing angles) data to match with the integrating sphere measurements. The conversion of the spectroradiometer based quantum efficiency and electroluminescence data from all different angular emission patterns was similar to that of the integrating sphere data within a reasonable range of deviation. As such, it is possible to reduce the recurring costs and required time between these two measurement techniques by bypassing the integrating sphere measurement. |
url |
http://dx.doi.org/10.1063/5.0013324 |
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