Entanglement entropy in integrable field theories with line defects II. Non-topological defect

Abstract This is the second part of two papers where we study the effect of integrable line defects on bipartite entanglement entropy in integrable field theories. In this paper, we consider non-topological line defects in Ising field theory. We derive an infinite series expression for the entanglem...

Full description

Bibliographic Details
Main Author: Yunfeng Jiang
Format: Article
Language:English
Published: SpringerOpen 2017-08-01
Series:Journal of High Energy Physics
Subjects:
Online Access:http://link.springer.com/article/10.1007/JHEP08(2017)013
Description
Summary:Abstract This is the second part of two papers where we study the effect of integrable line defects on bipartite entanglement entropy in integrable field theories. In this paper, we consider non-topological line defects in Ising field theory. We derive an infinite series expression for the entanglement entropy and show that both the UV and IR limits of the bulk entanglement entropy are modified by the line defect. In the UV limit, we give an infinite series expression for the coefficient in front of the logarithmic divergence and the exact defect g-function. By tuning the defect to be purely transmissive and reflective, we recover correctly the entanglement entropy of the bulk and with integrable boundary respectively.
ISSN:1029-8479